Resources

Purchasing surface analysis

Surface analysis can be purchased on a per sample, or half-day / full day basis. We can provide the as-collected data for you to analyse yourself, and we can also provide training to University of Sheffield members on how to do this. The University of Sheffield has a site licence for Casa XPS, the data analysis software we use. Alternatively, we can analyse the data for you and provide a brief report.

Please contact us to discuss your analysis requirements and if you wish to purchase analysis time.

XPS Requirements and COSHH forms

Surface analysis XPS requirements / COSHH forms must be filled in prior to analysis and must include a signature from the grant holder, departmental COSHH number, chemical structures and surface treatments. Hard copies or digital copies are acceptable.

• XPS COSHH (PDF, 429KB)

Other Techniques

For surface analysis by other techniques (AFM, ellipsometry, contact angle measurements, please contact the experimental officer. 

Information on sample preparation

Read more about sample preparation.

References

D. Briggs, A. Brown and J. Vickerman, Handbook of Static Secondary Ion Mass Spectrometry (SIMS), John Wiley and Sons, Chichester, 1989.

G. Beamson and D. Briggs, High Resolution XPS of Organic Polymers: The Scienta ESCA300 Database, John Wiley and Sons, Chichester, 1992.

J. Watts and J. Wolstenholme, An Introduction to Surface Analysis by XPS and AES, John Wiley and Sons, Chichester, 2003.

D. Briggs and M. Seah, Practical Surface Analysis Volume 1: Auger and X-ray Photoelectron Spectroscopy, John Wiley and Sons, Chichester, 1983.

D. Briggs and M. Seah, Practical Surface Analysis Volume 2: Ion and Neutral Spectroscopy, John Wiley and Sons, Chichester, 1983.

H. Tompkins, A User's Guide to Ellipsometry, Dover Publications Inc., New York, 1993.